Applied Scanning Probe Methods XI [electronic resource] : Scanning Probe Microscopy Techniques / by Bharat Bhushan, Harald Fuchs.

By: Bhushan, Bharat [author.]Contributor(s): Fuchs, Harald [author.] | SpringerLink (Online service)Material type: TextTextSeries: NanoScience and TechnologyPublisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009Description: LVI, 236 p. 113 illus., 22 illus. in color. online resourceContent type: text Media type: computer Carrier type: online resourceISBN: 9783540850373Subject(s): Engineering | Polymers | Surfaces (Physics) | Interfaces (Physical sciences) | Thin films | Spectroscopy | Microscopy | Nanotechnology | Materials -- Surfaces | Engineering | Nanotechnology and Microengineering | Spectroscopy and Microscopy | Surface and Interface Science, Thin Films | Nanotechnology | Surfaces and Interfaces, Thin Films | Polymer SciencesAdditional physical formats: Printed edition:: No titleDDC classification: 620.5 LOC classification: T174.7Online resources: Click here to access online
Contents:
Oscillation Control in Dynamic SPM with Quartz Sensors -- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation -- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies -- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science -- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements -- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip -- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations -- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
In: Springer eBooks
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Oscillation Control in Dynamic SPM with Quartz Sensors -- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation -- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies -- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science -- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements -- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip -- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations -- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.

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