Applied Scanning Probe Methods XI [electronic resource] : Scanning Probe Microscopy Techniques / by Bharat Bhushan, Harald Fuchs.
Material type:
Item type | Current library | Call number | Status | Date due | Barcode |
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Bangalore University Library | Available | BUSP011712 |
Oscillation Control in Dynamic SPM with Quartz Sensors -- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation -- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies -- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science -- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements -- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip -- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations -- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
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