Applied Scanning Probe Methods XI
Bhushan, Bharat.
Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques / [electronic resource] : by Bharat Bhushan, Harald Fuchs. - LVI, 236 p. 113 illus., 22 illus. in color. online resource. - NanoScience and Technology, 1434-4904 . - NanoScience and Technology, .
Oscillation Control in Dynamic SPM with Quartz Sensors -- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation -- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies -- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science -- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements -- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip -- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations -- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
9783540850373
10.1007/978-3-540-85037-3 doi
Engineering.
Polymers.
Surfaces (Physics).
Interfaces (Physical sciences).
Thin films.
Spectroscopy.
Microscopy.
Nanotechnology.
Materials--Surfaces.
Engineering.
Nanotechnology and Microengineering.
Spectroscopy and Microscopy.
Surface and Interface Science, Thin Films.
Nanotechnology.
Surfaces and Interfaces, Thin Films.
Polymer Sciences.
T174.7
620.5
Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques / [electronic resource] : by Bharat Bhushan, Harald Fuchs. - LVI, 236 p. 113 illus., 22 illus. in color. online resource. - NanoScience and Technology, 1434-4904 . - NanoScience and Technology, .
Oscillation Control in Dynamic SPM with Quartz Sensors -- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation -- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies -- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science -- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements -- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip -- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations -- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
9783540850373
10.1007/978-3-540-85037-3 doi
Engineering.
Polymers.
Surfaces (Physics).
Interfaces (Physical sciences).
Thin films.
Spectroscopy.
Microscopy.
Nanotechnology.
Materials--Surfaces.
Engineering.
Nanotechnology and Microengineering.
Spectroscopy and Microscopy.
Surface and Interface Science, Thin Films.
Nanotechnology.
Surfaces and Interfaces, Thin Films.
Polymer Sciences.
T174.7
620.5