Progress in Nano-Electro-Optics IV [electronic resource] : Characterization of Nano-Optical Materials and Optical Near-Field Interactions / edited by Motoichi Ohtsu.

Near-Field Imaging of Magnetic Domains -- Improvement of Interface Quality in Cleaved-Edge-Overgrowth GaAs Quantum Wires Based on Micro-optical Characterization -- Recombination Dynamics in InxGa1™xN-Based Nanostructures -- Quantum Theory of Radiation in Optical Near Field Based on Quantization of Evanescent Electromagnetic Waves Using Detector Mode.

This volume focuses on the characterization of nano-optical materials and optical-near field interactions. It begins with the techniques for characterizing the magneto-optical Kerr effect and continues with methods to determine structural and optical properties in high-quality quantum wires with high spatial uniformity. Further topics include: near-field luminescence mapping in InGaN/GaN single quantum well structures in order to interpret the recombination mechanism in InGaN-based nano-structures; and theoretical treatment of the optical near field and optical near-field interactions, providing the basis for investigating the signal transport and associated dissipation in nano-optical devices. Taken as a whole, this overview will be a valuable resource for engineers and scientists working in the field of nano-electro-optics.