Progress in Nano-Electro-Optics IV

Progress in Nano-Electro-Optics IV Characterization of Nano-Optical Materials and Optical Near-Field Interactions / [electronic resource] : edited by Motoichi Ohtsu. - XIV, 208 p. online resource. - Springer Series in Optical Sciences, 109 0342-4111 ; . - Springer Series in Optical Sciences, 109 .

Near-Field Imaging of Magnetic Domains -- Improvement of Interface Quality in Cleaved-Edge-Overgrowth GaAs Quantum Wires Based on Micro-optical Characterization -- Recombination Dynamics in InxGa1™xN-Based Nanostructures -- Quantum Theory of Radiation in Optical Near Field Based on Quantization of Evanescent Electromagnetic Waves Using Detector Mode.

This volume focuses on the characterization of nano-optical materials and optical-near field interactions. It begins with the techniques for characterizing the magneto-optical Kerr effect and continues with methods to determine structural and optical properties in high-quality quantum wires with high spatial uniformity. Further topics include: near-field luminescence mapping in InGaN/GaN single quantum well structures in order to interpret the recombination mechanism in InGaN-based nano-structures; and theoretical treatment of the optical near field and optical near-field interactions, providing the basis for investigating the signal transport and associated dissipation in nano-optical devices. Taken as a whole, this overview will be a valuable resource for engineers and scientists working in the field of nano-electro-optics.

9783540273080

10.1007/b138896 doi


Physics.
Quantum optics.
Optics.
Optoelectronics.
Plasmons (Physics).
Physics.
Optics, Optoelectronics, Plasmonics and Optical Devices.
Quantum Optics.

QC350-467 TA1501-1820 QC392-449.5 TA1750-1750.22

621.36

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