000 03644nam a22006015i 4500
001 978-3-319-15588-3
003 DE-He213
005 20161006171403.0
007 cr nn 008mamaa
008 150518s2015 gw | s |||| 0|eng d
020 _a9783319155883
_9978-3-319-15588-3
024 7 _a10.1007/978-3-319-15588-3
_2doi
050 4 _aQC176.8.N35
050 4 _aT174.7
072 7 _aTBN
_2bicssc
072 7 _aSCI050000
_2bisacsh
082 0 4 _a620.5
_223
245 1 0 _aNoncontact Atomic Force Microscopy
_h[electronic resource] :
_bVolume 3 /
_cedited by Seizo Morita, Franz J. Giessibl, Ernst Meyer, Roland Wiesendanger.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2015.
300 _aXXII, 527 p. 256 illus., 159 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aNanoScience and Technology,
_x1434-4904
505 0 _aFrom the Contents: Introduction -- 3D Force-Field Spectroscopy -- Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts -- Spectroscopy and Manipulation Using AFM/STM at Room Temperature -- The Phantom Force - The Influence of a Tunnel Current on Force Microscopy -- Non-Contact Friction -- Magnetic Exchange Force Spectroscopy.
520 _aThis book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.
650 0 _aPhysics.
650 0 _aNanoscale science.
650 0 _aNanoscience.
650 0 _aNanostructures.
650 0 _aSpectroscopy.
650 0 _aMicroscopy.
650 0 _aNanotechnology.
650 0 _aMaterials
_xSurfaces.
650 0 _aThin films.
650 1 4 _aPhysics.
650 2 4 _aNanoscale Science and Technology.
650 2 4 _aSurfaces and Interfaces, Thin Films.
650 2 4 _aSpectroscopy and Microscopy.
650 2 4 _aNanotechnology.
700 1 _aMorita, Seizo.
_eeditor.
700 1 _aGiessibl, Franz J.
_eeditor.
700 1 _aMeyer, Ernst.
_eeditor.
700 1 _aWiesendanger, Roland.
_eeditor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9783319155876
830 0 _aNanoScience and Technology,
_x1434-4904
856 4 0 _uhttp://dx.doi.org/10.1007/978-3-319-15588-3
912 _aZDB-2-CMS
999 _c224604
_d224604