000 04175nam a22005895i 4500
001 978-3-540-85039-7
003 DE-He213
005 20160302164649.0
007 cr nn 008mamaa
008 100301s2009 gw | s |||| 0|eng d
020 _a9783540850397
_9978-3-540-85039-7
024 7 _a10.1007/978-3-540-85039-7
_2doi
050 4 _aT174.7
072 7 _aTDPB
_2bicssc
072 7 _aTEC027000
_2bisacsh
082 0 4 _a620.5
_223
245 1 0 _aApplied Scanning Probe Methods XII
_h[electronic resource] :
_bCharacterization /
_cedited by Bharat Bhushan, Harald Fuchs.
264 1 _aBerlin, Heidelberg :
_bSpringer Berlin Heidelberg :
_bImprint: Springer,
_c2009.
300 _aLV, 224 p.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aNanoScience and Technology,
_x1434-4904
505 0 _aDirect Force Measurements of Receptor–Ligand Interactions on Living Cells -- Imaging Chemical Groups and Molecular Recognition Sites on Live Cells Using AFM -- Applications of Scanning Near-Field Optical Microscopy in Life Science -- Adhesion and Friction Properties of Polymers at Nanoscale: Investigation by AFM -- Mechanical Characterization of Materials by Micro-Indentation and AFM Scanning -- Mechanical Properties of Metallic Nanocontacts -- Dynamic AFM in Liquids: Viscous Damping and Applications to the Study of Confined Liquids -- Microtensile Tests Using In Situ Atomic Force Microscopy -- Scanning Tunneling Microscopy of the Si(111)-7×7 Surface and Adsorbed Ge Nanostructures.
520 _aCrack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore necessary to develop me- ods which in situ allow the experimental investigation of surface deformation and fracture processes in thin layers at a micro and nanometer scale. While scanning electron microscopy (SEM) might be used it is also associated with some major experimental drawbacks. First of all if polymers are investigated they usually have to be coated with a metal layer due to their commonly non-conductive nature. Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties. Furthermore, for all kinds of materials a considerable amount of expe- mental effort is necessary to build a tensile testing machine that ts into the chamber. Therefore, a very promising alternative to SEM is based on the use of an atomic force microscope (AFM) to observe in situ surface deformation processes during straining of a specimen. First steps towards this goal were shown in the 1990s in [1–4] but none of these approaches truly was a microtensile test with sample thicknesses in the range of micrometers. To the authors’ knowledge, this was shown for the rst time by Hild et al. in [5]. 16.
650 0 _aEngineering.
650 0 _aPolymers.
650 0 _aSurfaces (Physics).
650 0 _aInterfaces (Physical sciences).
650 0 _aThin films.
650 0 _aSpectroscopy.
650 0 _aMicroscopy.
650 0 _aNanotechnology.
650 0 _aMaterials
_xSurfaces.
650 1 4 _aEngineering.
650 2 4 _aNanotechnology and Microengineering.
650 2 4 _aSpectroscopy and Microscopy.
650 2 4 _aSurface and Interface Science, Thin Films.
650 2 4 _aNanotechnology.
650 2 4 _aSurfaces and Interfaces, Thin Films.
650 2 4 _aPolymer Sciences.
700 1 _aBhushan, Bharat.
_eeditor.
700 1 _aFuchs, Harald.
_eeditor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9783540850380
830 0 _aNanoScience and Technology,
_x1434-4904
856 4 0 _uhttp://dx.doi.org/10.1007/978-3-540-85039-7
912 _aZDB-2-CMS
999 _c186059
_d186059