000 04314nam a22006015i 4500
001 978-3-540-37316-2
003 DE-He213
005 20160302162901.0
007 cr nn 008mamaa
008 100301s2007 gw | s |||| 0|eng d
020 _a9783540373162
_9978-3-540-37316-2
024 7 _a10.1007/978-3-540-37316-2
_2doi
050 4 _aT174.7
072 7 _aTDPB
_2bicssc
072 7 _aTEC027000
_2bisacsh
082 0 4 _a620.5
_223
245 1 0 _aApplied Scanning Probe Methods V
_h[electronic resource] :
_bScanning Probe Microscopy Techniques /
_cedited by Bharat Bhushan, Satoshi Kawata, Harald Fuchs.
264 1 _aBerlin, Heidelberg :
_bSpringer Berlin Heidelberg,
_c2007.
300 _aXLV, 344 p.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aNanoScience and Technology,
_x1434-4904
505 0 _aIntegrated Cantilevers and Atomic Force Microscopes -- Electrostatic Microscanner -- Low-Noise Methods for Optical Measurements of Cantilever Deflections -- Q-controlled Dynamic Force Microscopy in Air and Liquids -- High-Frequency Dynamic Force Microscopy -- Torsional Resonance Microscopy and Its Applications -- Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy -- Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale -- New AFM Developments to Study Elasticity and Adhesion at the Nanoscale -- Near-Field Raman Spectroscopy and Imaging.
520 _aThe scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.
650 0 _aEngineering.
650 0 _aPolymers.
650 0 _aSurfaces (Physics).
650 0 _aInterfaces (Physical sciences).
650 0 _aThin films.
650 0 _aSpectroscopy.
650 0 _aMicroscopy.
650 0 _aNanotechnology.
650 0 _aMaterials
_xSurfaces.
650 1 4 _aEngineering.
650 2 4 _aNanotechnology and Microengineering.
650 2 4 _aSpectroscopy and Microscopy.
650 2 4 _aSurface and Interface Science, Thin Films.
650 2 4 _aNanotechnology.
650 2 4 _aSurfaces and Interfaces, Thin Films.
650 2 4 _aPolymer Sciences.
700 1 _aBhushan, Bharat.
_eeditor.
700 1 _aKawata, Satoshi.
_eeditor.
700 1 _aFuchs, Harald.
_eeditor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9783540373155
830 0 _aNanoScience and Technology,
_x1434-4904
856 4 0 _uhttp://dx.doi.org/10.1007/978-3-540-37316-2
912 _aZDB-2-CMS
999 _c178865
_d178865