Applied Logistic Regression David W Hosmer and Stanley Lemeshow

By: Hosmer, David WContributor(s): Lemeshow, Stanley [Author]Material type: TextTextLanguage: ENG Series: Wiley Series in Prohbability and Statistics Texts and references Section ; Publication details: New York John Wiley & Sons, Inc 2000Edition: 2nd edDescription: xii,373pISBN: 0471356328Subject(s): Logistc RegressionDDC classification: 519.536
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Item type Current library Call number Status Date due Barcode
Books Books Bangalore University Library
DL 		519.536 HOS L (Browse shelf (Opens below)) Available 286629

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