TY  - BOOK
AU  - Gyvez, Pineda Jose De 
TI  - Integrated Circuit Manufacturability: the art of Process and Design Integration 
SN  - 9780780334472
U1  - 621.3815 
PY  - 1999///
CY  - New York
PB  - IEEE Press, 
KW  - Defect Monitoring
KW  - Acceptability
N1  - Index
ER  -