TY  - BOOK
AU  - Bhushan,Bharat
AU  - Fuchs,Harald
ED  - SpringerLink (Online service)
TI  - Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques 
T2  - NanoScience and Technology,
SN  - 9783540850373
AV  - T174.7 
U1  - 620.5 23
PY  - 2009///
CY  - Berlin, Heidelberg
PB  - Springer Berlin Heidelberg
KW  - Engineering
KW  - Polymers
KW  - Surfaces (Physics)
KW  - Interfaces (Physical sciences)
KW  - Thin films
KW  - Spectroscopy
KW  - Microscopy
KW  - Nanotechnology
KW  - Materials
KW  - Surfaces
KW  - Nanotechnology and Microengineering
KW  - Spectroscopy and Microscopy
KW  - Surface and Interface Science, Thin Films
KW  - Surfaces and Interfaces, Thin Films
KW  - Polymer Sciences
N1  - Oscillation Control in Dynamic SPM with Quartz Sensors -- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation -- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies -- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science -- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements -- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip -- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations -- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction
UR  - http://dx.doi.org/10.1007/978-3-540-85037-3
ER  -