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Physical Measurement and Analysis of Thin Films edited by E M Murt and W G Guldner

Contributor(s): Murt, E M [Editor] | Guldner, W G [Editor]Material type: Text

TextLanguage: ENG Series: Progress in Analytical Chemistry ; V2Publication details: New York Plenum Press 1969Edition: Description: xi,194pSubject(s): Thin FilmsDDC classification: 532.6

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Item type	Current library	Call number	Status	Date due	Barcode
Books	Bangalore University Library DL	532.6 MUR G (Browse shelf (Opens below))	Available		127595

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