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Integrated circuit manufacturability: the art of process and design integration

By: Gyvez, Jose PinedaContributor(s): Pradhan, DhirajMaterial type: Text

TextPublication details: New York: Institute of Electrical and electronics engineers, Inc. 1999Description: xv, 316p. 24cmISBN: 0780334477Subject(s): Defect modeling | Defect monitoring | Functional yield modelingDDC classification: 621.3815

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Books	University Visvesvarayya College of Engineering On Display	621.3815 GYV P (Browse shelf (Opens below))	Available		UV097924

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Previous	621.3815 GRE Field effect devices and applications devices for portable, low-power, and imaging systems	621.3815 GRO Electronic Circuits and Application	621.3815 GYV P Integrated Circuit Manufacturability: the art of Process and Design Integration	621.3815 GYV P Integrated circuit manufacturability: the art of process and design integration	621.3815 GYV P Integrated circuit manufacturability: the art of process and design integration	621.3815 GYV P Integrated Circuit Manufacturability: the art of Process and Design Integration	621.3815 HAY Adaptive filter theory	Next

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