Vlsi Test Principles and Architectures
Material type:
TextPublication details: New Delhi: Elsevier; 2006Description: 777p. 23cmISBN: 9780123705976Subject(s): Introduction | Design for testability | Logic and Fault SimulationDDC classification: 621.395
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University Visvesvarayya College of Engineering On Display | 621.395 WAN W (Browse shelf (Opens below)) | Available | UV100781 | |
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University Visvesvarayya College of Engineering On Display | 621.395 WAN W (Browse shelf (Opens below)) | Available | UV105386 |
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| 621.395 WAK Digital design: principles and practices | 621.395 WAN W Vlsi Test Principles and Architectures | 621.395 WAN W VLSI test principles and architectures design for testability | 621.395 WAN W Vlsi Test Principles and Architectures | 621.395 WES Principles of CMOS VLSI design : a systems perspective | 621.395 WES Principles of CMOS VLSI design : a systems perspective | 621.395 WES Principles of CMOS VLSI design : a systems perspective |
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