Normal view MARC view ISBD view

Applied Scanning Probe Methods IV Industrial Applications / [electronic resource] : edited by Bharat Bhushan, Harald Fuchs. - XLIV, 284 p. online resource. - NanoScience and Technology, 1434-4904 . - NanoScience and Technology, .

Scanning Probe Lithography for Chemical, Biological and Engineering Applications -- Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM) -- Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography -- Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography -- Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM) -- Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection -- Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices -- Applications of Heated Atomic Force Microscope Cantilevers.

ISBN: 9783540269144

Standard No.: 10.1007/b138289 doi

Subjects--Topical Terms:
Engineering.
Polymers.
Surfaces (Physics).
Interfaces (Physical sciences).
Thin films.
Spectroscopy.
Microscopy.
Nanotechnology.
Materials--Surfaces.
Engineering.
Nanotechnology and Microengineering.
Spectroscopy and Microscopy.
Surface and Interface Science, Thin Films.
Nanotechnology.
Surfaces and Interfaces, Thin Films.
Polymer Sciences.

LC Class. No.: T174.7

Dewey Class. No.: 620.5